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 Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B) free ebook download



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Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)
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Author(s): Nicola Nicolici
Date: 2024 Format: pdf Language: English ISBN/ASIN: 140207235X  
Pages: 189 OCR: Quality: ISBN13:  
Uploader: gestalt Upload Date: 9/26/2023 1:15:04 PM      
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Tags: 1149.4 Circuits Frontiers Guide IEEE Power-Constrained Standard Test Testing VLSI

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