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High Quality Test Pattern Generation and Boolean Satisfiability free ebook download

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Mathematics

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Author(s):	Stephan Eggersglu?

Date:	2012	Format:	pdf	Language:	English	ISBN/ASIN:	1441999752
Pages:	1	OCR:		Quality:		ISBN13:
Uploader:	tvladb77	Upload Date:	11/11/2021 9:56:47 AM

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This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

The aim of the techniques and methodologies presented in this book is to improve SAT-based ATPG, in order to make it applicable in industrial practice. Readers will learn to improve the performance and robustness of the overall test generation process, so that the ATPG algorithm reliably will generate test patterns for most targeted faults in acceptable run time to meet the high fault coverage demands of industry. The techniques and improvements presented in this book provide the following advantages:

Provides a comprehensive introduction to test generation and Boolean Satisfiability (SAT) 
     Describes a highly fault efficient SAT-based ATPG framework 
    Introduces circuit-oriented SAT solving techniques, which make use of structural information and are able to accelerate the search process significantly 
    Provides SAT formulations for the prevalent delay faults models, in addition to the classical stuck-at fault model 
    Includes an industrial perspective on the state-of-the-art in the testing, along with SAT  two topics typically distinguished from each other.

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3049843	Book	https://novafile.com/file/53wd9r1uz8rf...		0.00	tvladb77

Tags: Boolean Generation High Pattern Quality Satisfiability Test

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High Quality Test Pattern Generation and Boolean Satisfiability free ebook download

Category: Mathematics

Description: Click to see full description

Category:
Mathematics